MDC will tailor your CSM/Win Semiconductor Measurement System for your exact requirements. Choose the best capacitance meter, output device, and probe station for your needs. All CSM/Win C-V plotters feature the latest Dell Computers. The computer and capacitance meters are rackmounted in one compact enclosure. When ordered with a hot chuck or probe station, MDC can deliver a turnkey system of unparalleled performance.
MDC offers the latest instruments from Agilent, Keithley, and Boonton to match every measurement need from routine production to advanced research. Most meters can be interfaced with a CSM/Win System. A list of the more popular meters can be found below.
Available meters include:
CSM/Win Systems can be interfaced with most legacy capacitance meters such as the HP 4275, 4284A, Keithley 590, Boonton 72B, etc. Customers who wish to integrate their meters into a CSM/Win System should contact the engineers at MDC.
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